Apparatus and methods for testing circuit elements at one or more manufacturing stages
AssigneeAres Technologies, Inc.
InventorsChristian T Wentz, Ilia Lebedev
Life of this patent
Estimating the term…
Abstract
A method for testing circuit elements at one or more manufacturing stages comprising receiving, at a circuit verifier a fingerprint of at least a circuit element to be manufactured, wherein the fingerprint further comprises at least an expected output corresponding to at least a test input, transmitting, from the circuit verifier the at least a test input to the at least a circuit element, receiving, at the circuit verifier at least a test output from the at least a circuit element, and comparing, by the circuit verifier the at least a test output to the at least an expected output of the fingerprint of the at least a circuit element.
Claims20
A method of testing circuit elements at one or more manufacturing stages, the method comprising:
- receiving, at a circuit verifier, from a first manufacturer of a first circuit element, a first attested fingerprint the first circuit element, wherein the first attested fingerprint further comprises a first expected output corresponding to a first test input;
- receiving, at the circuit verifier, from a second manufacturer of a second circuit element, a second attested fingerprint of the second circuit element, wherein the second attested fingerprint further comprises a second expected output corresponding to a second test input, wherein the first attested fingerprint is different from the second attested fingerprint, and wherein the second attested fingerprint is generated as a function of the first attested fingerprint;
- transmitting, from the circuit verifier, the first test input and the second test input to the first circuit element and the second circuit element, respectively;
- receiving, at the circuit verifier, the first test output and the second test output from the first circuit element and the second circuit element, respectively;
- comparing, by the circuit verifier, the first test output and the second test output to the first expected output and the second expected output of the fingerprint of the first circuit element and the second circuit element;
- and
- generating, by the circuit verifier, an attestation of a result of the comparison.
An apparatus for testing circuit elements at one or more manufacturing stages, the apparatus comprising:
- a circuit verifier communicatively coupled to a plurality of circuit elements, the circuit verifier designed and configured to:
- receive, from a first manufacturer of a first circuit element, a first attested fingerprint the first circuit element, wherein the first attested fingerprint further comprises a first expected output corresponding to a first test input;
- receive, at a circuit verifier, from a second manufacturer of a second circuit element, a second attested fingerprint of the second circuit element, wherein the second attested fingerprint further comprises a second expected output corresponding to a second test input, wherein the first attested fingerprint is different from the second attested fingerprint, and wherein the second attested fingerprint is generated as a function of the first attested fingerprint;
- transmitting the first test input and the second test input to the first circuit element and the second circuit element, respectively;
- receive the first test output and the second test output from the first circuit element and the second circuit element, respectively;
- comparing the first test output and the second test output to the first expected output and the second expected output of the fingerprint of the first circuit element and the second circuit element
- generate an attestation of a result of the comparison.
Dependencies are inferred from the claim text.