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US 11,598,981 B2Granted
Analyzing microtextured regions of optically anisotropic materials
AssigneeMRL Materials Resources LLC
InventorsDaniel P. Satko, Ayman A. Salem
Life of this patent
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Abstract
Images of samples that are illuminated with polarized light are captured. Azimuth and inclination data are extracted from the captured images. The azimuth and inclination data are used to quantify MTRs.
Claims4
A process for analyzing microtextured regions comprising:
- positioning a sample at multiple designated discrete rotational angles relative to a polarization axis of a polarizer;
- illuminating the sample at each designated rotational angle with a polarized monochromatic light;
- capturing images of the illuminated sample at each designated rotational angle;
- flat-field correcting each captured image to produce flat-field corrected images;
- performing image rotation of the flat-field corrected images to produce rotation-corrected images;
- performing image registration of the rotation-corrected images to produce registered images;
- extracting amplitude values and phase values of an intensity modulation at each pixel from the registered images;
- correlating inclination of an optic axis to the extracted amplitude values;
- correlating azimuth of the optic axis to the extracted phase values;
- and
- quantifying microtextured regions (MTRs) from the azimuth and inclination.
8 more elements
Dependencies are inferred from the claim text.