Method and system for determining dielectric properties of an object

A system for obtaining dielectric properties of an object, the system comprising:

• at least a pair of transceivers positioned in spatially fixed relationships relative to one another and configured to generate and detect radiation in at least one of a microwave-wave region and millimeter-wave region of electromagnetic spectrum, wherein a portion of said transceivers is configured to generates-polarized radiation and another portion of the transceivers is configured to generate p-polarized radiation, and
• a processor configured to implement:
• a controller configured to activate the transceivers so as to irradiate at least a portion of the object with p-polarized radiation and withs-polarized radiation, wherein each of said transceivers detects s- and p-polarized radiation reflected from the object in response to irradiation of the object by radiation generated by at least another transceiver and generates reflection detection signals, and
• an analyzer configured to analyze said reflection detection signals to compute a plurality of pair-wise reflectivity coefficients for the s- and p-polarized illuminating radiation and utilizing said reflectivity coefficients to compute complex permittivity of one or more dielectric layers of the object, wherein each of the reflectivity coefficients is associated with a pair of transceivers.