US 11,598,811 B2Granted

Method, apparatus, and computer storage medium for identifying cell

AssigneeContemporary Amperex Technology Co., Limited

InventorsJian Ruan, Mingshu Du, Shichao Li, Shenzhi Tang, Yanhua Lu, Wei Zhang

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Abstract

The present disclosure discloses a method for identifying a cell, including: determining, for a cell under test during a charge and discharge process, a number N of measured values of OCV and a number N of net cumulative throughputs corresponding to the number N of measured values of OCV; for an ith target cell, obtaining a number N of calculated values of OCV corresponding to the number N of measured values of OCV, and obtaining an OCV mean square error between the number N of measured values of OCV and the number N of calculated values of OCV; and determining that the cell under test is the ith target cell, when the OCV mean square error between the cell under test and the ith target cell is a minimum mean square error among a number M of OCV mean square errors.

Claims9

Dependent claims

A method for identifying a cell under test, comprising:

determining, for the cell under test during a charge and discharge process, a number N of measured values of open circuit voltage (OCV) and a number N of net cumulative throughputs corresponding to the number N of measured values of OCV, based on searched historical charge and discharge data for the cell under test or test data obtained by intermittently charging and discharging the cell under test;
obtaining, for an ith target cell, a number N of first state of charge (SOC) values corresponding to the number N of measured values of OCV, according to the number N of measured values of OCV and a first correspondence between an open circuit voltage and a SOC for the ith target cell;
determining a second correspondence between the net cumulative throughputs and the states of charge for the ith target cell, according to the number N of net cumulative throughputs and the number N of first SOC values;
obtaining, for the ith target cell, a number N of second SOC values corresponding to the number N of net cumulative throughputs, according to the number N of net cumulative throughputs and the second correspondence;
obtaining, for the ith target cell, a number N of calculated values of OCV corresponding to the number N of second SOC values, according to the number N of second SOC values and the first correspondence;
obtaining an OCV mean square error between the cell under test and the ith target cell, based on the number N of measured values of OCV and the number N of calculated values of OCV;
identifying the cell under test as the ith target cell, when the OCV mean square error between the cell under test and the ith target cell is a minimum mean square error among a number M of OCV mean square errors,
wherein M represents a total number of target cells, 1≤i≤M, and both M and N are positive integers greater than 1.

5 more elements

An apparatus for cell identification, comprising:

a determination unit, configured to determine, for a cell under test during a charge and discharge process, a number N of measured values of open circuit voltage (OCV) and a number N of net cumulative throughputs corresponding to the number N of measured values of OCV, based on searched historical charge and discharge data for the cell under test or test data obtained by intermittently charging and discharging the cell under test;
a calculation unit, configured to obtain, for an ith target cell, a number N of first state of charge (SOC) values corresponding to the number N of measured values of OCV, according to the number N of measured values of OCV and a first correspondence between an open circuit voltage and a SOC for the ith target cell;
determine a second correspondence between the net cumulative throughputs and the states of charge for the ith target cell, according to the number N of net cumulative throughputs and the number N of first SOC values;
obtain, for the ith target cell, a number N of second SOC values corresponding to the number N of net cumulative throughputs, according to the number N of net cumulative throughputs and the second correspondence;
obtain, for the ith target cell, a number N of calculated values of OCV corresponding to the number N of second SOC values, according to the number N of second SOC values and the first correspondence;
obtain an OCV mean square error between the cell under test and the ith target cell, based on the number N of measured values of OCV and the number N of calculated values of OCV;
an identification unit, configured to identify the cell under test as the ith target cell when the OCV mean square error between the cell under test and the ith target cell is a minimum mean square error among a number M of OCV mean square errors,
wherein M represents a total number of target cells, 1≤i≤M, and both M and N are positive integers greater than 1.

5 more elements

Dependencies are inferred from the claim text.

Facts

Application: 17/745,921Filed 17 May 2022 · continuation
Priority: CN 202010667411.113 Jul 2020
Published: US 2022/0276310 A11 Sep 2022
Granted: 7 Mar 2023
Term ends: Not estimatedThe source records don’t support an estimate.

Classification9 codes

G01R 31/3646
Constructional arrangements: for indicating electrical conditions or variables, e.g. visual or audible indicators
G01R 31/3648
Constructional arrangements: comprising digital calculation means, e.g. for performing an algorithm
G01R 31/388
Determining ampere-hour charge capacity or SoC: involving voltage measurements
G01R 31/396
Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of…