Test apparatus and test method to a memory device
AssigneeNanya Technology Corporation
InventorsYu-Wei Tseng, Chih-Ming Chang, Wan-Chun Fang, Jui-Chung Hsu, Chun-Hsi Li
Life of this patent
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Abstract
A test system is disclosed. The test system includes a tester, a first voltage stabilization circuit, and a device under test (DUT). The tester generates a first operational voltage and a control signal. The first voltage stabilization circuit transmits a second operational voltage, associated with the first operational voltage, to a socket board. The DUT operates with the second operational voltage received through the socket board. The first voltage stabilization circuit is further configured to control, according to the control signal, the second operational voltage to have a first voltage level when the DUT is operating.
Claims12
A test system, comprising:
- a tester configured to generate a first operational voltage and a control signal;
- a first voltage stabilization circuit configured to transmit a second operational voltage, associated with the first operational voltage, to a socket board;
- and
- a device under test (DUT) configured to operate with the second operational voltage received through the socket board,
- wherein the first voltage stabilization circuit comprises:
- a comparison circuit configured to compare the second operational voltage with an initial voltage indicated by the control signal, and to generate a feedback signal;
- and
- an adjustment circuit configured to pull up, according to the feedback signal, the voltage level of the second operational voltage to a first voltage level when the DUT is operating.
A test method, comprising:
- operating a device under test (DUT) with a first operational voltage;
- comparing, by a first comparison circuit comprised in a first voltage stabilization circuit, a voltage level of the first operational voltage with a voltage level of a first initial voltage;
- when the voltage level of the first operational voltage is different from the first initial voltage, adjusting, by a first adjustment circuit comprised in the first voltage stabilization circuit, the voltage level of the first operational voltage to the voltage level of the first initial voltage,
- generating, by the first comparison circuit, a feedback signal in response to the comparison, to the adjustment circuit;
- and
- pulling up, by the first adjustment circuit, the voltage level of the first operational voltage.
Dependencies are inferred from the claim text.