Low frequency S-parameter measurement
AssigneeTektronix, Inc.
InventorsJohn J. Pickerd, Kan Tan
Life of this patent
Estimating the term…
Abstract
A method determines scattering parameters, S-parameters, for a device under test for a first frequency range. The method includes receiving S-parameters for the device under test for a second frequency range, the second frequency range greater than the first frequency range. Generally, the S-parameters for the device under test for the second frequency range can be determined using known methods. The method further includes measuring an actual response of the device under test, determining a desired signal of the device under test, and determining the S-parameters for the device under test for the first frequency range based the S-parameters for the second frequency range, actual response of the device under test and the desired signal of the device under test.
Claims20
A method for determining, by one or more processors, scattering parameters, S-parameters, for a device under test for a first frequency range, comprising:
- receiving S-parameters for the device under test for a second frequency range, where the second frequency range is from a frequency f1 up to a frequency f2, where f1 is greater than zero, and the first frequency range is from a frequency greater than or equal to zero frequency, DC, up to the frequency f1;
- measuring an actual signal of the device under test;
- determining a desired signal of the device under test;
- and
- determining the S-parameters for the device under test for the first frequency range based on the S-parameters for the second frequency range, the actual signal of the device under test, and the desired signal of the device under test.
A test and measurement system, comprising:
- a step generator configured to generate a step signal as input to a device under test;
- a test and measurement instrument configured to measure an actual response of the device under test based on the step signal;
- and
- one or more processors configured to:
- receive the actual response of the device under test from the test and measurement instrument,
- determine a desired signal of the device under test, and
- determine scattering parameters, S-parameters, for the device under test for a first frequency range based on received S-parameters for the device under test for a second frequency range, the actual response of the device under test, and the desired signal of the device under test, where the second frequency range is from a frequency f1 up to a frequency f2, where f1 is greater than zero, and the first frequency range is from a frequency greater than or equal to zero frequency, DC, up to the frequency f1.
One or more computer-readable storage media comprising instructions, which, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to:
- measure an actual step response signal of a device under test;
- determine a desired step response signal of the device under test;
- and
- determine scattering parameters, S-parameters, for the device under test for a first frequency range based on received S-parameters for the device under test for a second frequency range, the actual step response signal of the device under test and the desired step response signal of the device under test, where the second frequency range is from a frequency f1 up to a frequency f2, where f1 is greater than zero, and the first frequency range is from a frequency greater than or equal to zero frequency, DC, up to the frequency f1.
Dependencies are inferred from the claim text.