Apparatus and method for detecting defective component using infrared camera
AssigneeSamsung Electronics Co., Ltd.
InventorDongik Lee
Life of this patent
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Abstract
Disclosed is an apparatus for detecting a defective component includes an infrared camera configured to capture an image of a test-target component in a production process, and a processor configured to measure a temperature of the component based on the image captured by the infrared camera and identify that the component of which temperature is out of a range of a reference value is defective. In addition, a database of various causes of defect is established, and an expected cause of defect for a defective component or a retest component is reasoned out from the database based on the measured temperature.
Claims16
A method comprising:
- (a) applying driving power to a test-target component;
- (b) measuring a temperature of the test-target component, to which the driving power is applied, with an infrared camera;
- (c) comparing data of the measured temperature with a predetermined reference value of a normal component, to thereby produce a comparison result;
- (d) based on the comparison result, identifying whether or not the test-target component is a defective component;
- (e) storing distribution data corresponding to statistical information of measured temperature values of a plurality of test-target components, the distribution data being represented as a graph to define a normal area based on an average or median of measured temperatures of the plurality of test-target components and defective areas corresponding to outer areas on the left and right sides of the normal area;
- (f) comparing the data of the measured temperature with the distribution data when the test-target component is not defective based on the identification result of (d);
- and
- (g) identifying whether the test-target component is a normal component having a temperature which is within a range of the normal area or a defective component having a temperature which is within a range of the defective areas based on the comparison result of (f).
An apparatus comprising:
- an infrared camera configured to capture an image of a test-target component to which driving power is applied;
- a storage unit configured to store a predetermined reference value of a normal component;
- and
- a processor configured to:
- measure a temperature of the test-target component based on the image captured by the infrared camera,
- compare data of the measured temperature with the predetermined reference value stored in the storage unit to thereby produce a comparison result, and
- identify whether or not the test-target component is a defective component based on the comparison result,
- wherein the storage unit stores distribution data corresponding to statistical information of measured temperature values of a plurality of test-target components, the distribution data being represented as a graph to define a normal area based on an average or median of measured temperatures of the plurality of test-target components and defective areas corresponding to outer areas on the left and right sides of the normal area, and
- the processor is configured to compare the data of the measured temperature with the distribution data stored in the storage unit when the test-target component is not defective based on the identification result, and identify whether the test-target component is a normal component having a temperature which is within a range of the normal area or a defective component having a temperature which is within a range of the defective areas.
Dependencies are inferred from the claim text.