Particle size measurement method, particle size measurement apparatus, and particle size measurement program
AssigneeOtsuka Electronics Co., Ltd.
InventorIkuo Wakayama
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AssigneeOtsuka Electronics Co., Ltd.
InventorIkuo Wakayama
Estimating the term…
Provided are a particle size measurement method, a particle size measurement apparatus, and a particle size measurement program in which a needless measurement time period is omitted by setting an appropriate measurement time period in accordance with a particle size to be measured. The particle size measurement method includes: a test measurement step; an autocorrelation function calculation step; a setting step of setting a part of a plurality of measurement timings set in advance as measurement timings to be used for main measurement, based on a time period required until an autocorrelation function falls below a predetermined threshold value and a preliminary time period set and added to the time period; a main measurement step of measuring a main measurement intensity of scattered light during a main measurement time period; and a particle size calculation step of calculating a particle size of a sample.
A particle size measurement method, comprising:
A particle size measurement apparatus, comprising:
A particle size measurement program for causing a computer, which is used in a particle size measurement apparatus configured to measure a particle size of a sample, to execute:
Dependencies are inferred from the claim text.