Abnormality detector of a manufacturing machine using machine learning
AssigneeFanuc Corporation
InventorsHirosato Yoshida, Nobuyuki Ootake
Life of this patent
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AssigneeFanuc Corporation
InventorsHirosato Yoshida, Nobuyuki Ootake
Estimating the term…
An abnormality detector includes a signal output unit for detecting a sign of an abnormality based on a physical quantity acquired from a manufacturing machine and outputting a signal; and a machine learning device including state observation unit for observing, as a state variable representing a present state of the environment, physical quantity data indicating the physical quantity related to an operation of the manufacturing machine from the manufacturing machine; a label data acquisition unit for acquiring, as label data, operation state data indicating an operation state of the manufacturing machine; a learning unit for learning the operation state of the manufacturing machine with respect to the physical quantity, using the state variable and the label data; and an estimation result output unit for estimating the operation state of the manufacturing machine using a learning result by the learning unit and outputting an estimation result.
An abnormality detector for a manufacturing machine, the abnormality detector comprising:
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