Internal defect detection system, three-dimensional additive manufacturing device, internal defect detection method, method of manufacturing three-dimensional additive manufactured product, and three-dimensional
AssigneeMitsubishi Heavy Industries, Ltd.
InventorsRyuichi Narita, Toshiya Watanabe, Akio Kondou, Masashi Kitamura, Hidetaka Haraguchi, Shuji Tanigawa, Claus Thomy, Henry Koehler
Life of this patent
Estimating the term…