Back to results
US 11,583,928 B2Granted
Additive manufacturing based multi-layer fabrication/repair
AssigneeRaytheon Technologies Corporation
InventorsRanadip Acharya, Vijay Narayan Jagdale
Life of this patent
Estimating the term…
Abstract
A method of additively manufacturing includes generating a thermal model driven scan map that identifies an equiaxed cap region, a single crystal (SX) region, and a columnar to equiaxed transition (CET) region; and forming an active melt pool with respect to the thermal model driven scan map such that a depth of the active melt pool is greater than a thickness of the equiaxed transition (CET) region.
Claims7
A method of additively manufacturing, comprising:
- generating a thermal model driven scan map;
- maintaining an active melt pool of an active melt pool scan pattern with respect to the thermal model driven scan map such that a depth of the active melt pool is greater than a thickness of a columnar to equiaxed transition (CET) region;
- restricting a scan rotation to zero and unidirectional movement of the active melt pool scan pattern to assure columnar single crystal (SX) growth;
- utilizing the thermal model driven scan map to model residual stress to simulate and prevent residual stress and a propensity of hot cracking;
- and
- utilizing the thermal model driven scan map to define a morphology, wherein the morphology includes a directionally solidified (DS) microstructure;
- wherein the thermal model driven scan map identifies the columnar to equiaxed transition (CET) region.
4 more elements
A method of additively manufacturing, comprising:
- locating a cast single crystal (SX) baseplate in an additively manufacturing machine;
- initiating formation of an active melt pool in the cast single crystal (SX) baseplate via an active melt pool scan pattern;
- generating a thermal model driven scan map that identifies an equiaxed cap region, a single crystal (SX) region, and a columnar to equiaxed transition (CET) region;
- maintaining the active melt pool with the active melt pool scan pattern in accords with the thermal model driven scan map such that a depth of the active melt pool is greater than a thickness of a columnar to equiaxed transition (CET) region;
- restricting a scan rotation to zero and unidirectional movement of the active melt pool scan pattern to assure columnar single crystal (SX) growth;
- utilizing the thermal model driven scan map to model residual stress to simulate and prevent residual stress and a propensity of hot cracking;
- and
- utilizing the thermal model driven scan map to define a morphology, wherein the morphology includes a directionally solidified (DS) microstructure.
5 more elements
Dependencies are inferred from the claim text.