Phase response measurement method and apparatus
AssigneeFujitsu Limited
InventorsYangyang Fan, Zhenning Tao
Life of this patent
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AssigneeFujitsu Limited
InventorsYangyang Fan, Zhenning Tao
Estimating the term…
An apparatus at least includes a processor to, after a first signal passes through a narrowband photodetector, perform frequency mix of the first signal with a first reference signal and a second reference signal respectively and perform noise reduction, to obtain a first detection signal and a second detection signal. The first signal is obtained after a measurement signal passes through a filtering module of an optical transmitting end, the measurement signal being transmitted in a path of multiple branches, signals not transmitted in other paths of the multiple branches, a frame structure of the measurement signal including at least one two-tone signal, two tones in the two-tone signal having a fixed tone interval. The processor is to calculate group delays at multiple frequency bins according to the first detection signal and the second detection signal; and determine a phase response of the filtering module of the optical transmitting end in the path according to the group delays at multiple frequency bins.
A phase response measurement apparatus, comprising:
A phase response measurement method, comprising:
Dependencies are inferred from the claim text.