Correlation between emission spots utilizing CAD data in combination with emission microscope images

A system comprising:

• a memory storing instructions;
• and
• a processor, coupled with the memory and to execute the instructions, the instructions when executed cause the processor to perform operations comprising:
• capturing a photon emission microscope (PEM) image of an integrated circuit (IC);
• identifying emission sites in the PEM image, the emission sites being associated with a leakage current;
• finding a set of common nets connecting multiple emission sites using at least one or more of layout data obtained from computer-aided design (CAD) data and netlist data obtained from the CAD data;
• identifying, from the at least one or more of the layout data and the netlist data, a net from the set of common nets that connects to a number of emission sites that satisfies a threshold number;
• cross-mapping, by a processor, the identified net identified from the layout data to netlist data in the CAD data:
• identifying, from the netlist data, a particular device having an output pin connected to the identified net;
• and
• cross-mapping, by a processor, the particular device identified from the netlist data to the layout data,
• wherein the identified net connects at least two devices at the identified emission sites including the particular device.

A non-transitory computer readable medium comprising stored instructions, which when executed by a processor, cause the processor to perform operations comprising:

• capturing a photon emission microscope (PEM) image of an integrated circuit (IC);
• identifying emission sites in the PEM image, the emission sites being associated with a leakage current;
• finding a set of common nets connecting multiple emission sites using at least one or more of layout data obtained from computer-aided design (CAD) data and netlist data obtained from the CAD data;
• identifying, from the at least one or more of the layout data and the netlist data, a net from the set of common nets that connects to a number of emission sites that satisfies a threshold number;
• cross-mapping, by a processor, the identified net identified from the layout data to netlist data in the CAD data;
• identifying, from the netlist data, a particular device having an output pin connected to the identified net;
• and
• cross-mapping, by a processor, the particular device identified from the netlist data to the layout data,
• wherein the identified net connects at least two devices at the identified emission sites including the particular device.