# US 11,543,641 B2 · Method and system for full-field interference microscopy imaging > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,543,641 B2 - Document ID: US11543641B2 - Status: Granted - Kind: B2 - Application number: 16/837,031 - Filed: 2020-04-01 - Published: 2020-07-23 - Granted: 2023-01-03 - Earliest claimed: 2015-04-10 - Assignees: Lltech Management - Applicants: Lltech Management - Inventors: Albert Claude Boccara; Fabrice Harms - Web page: https://patentgrep.com/patent/US11543641B2 ## CPC - G02B 21/125: {affording both dark- and bright-field illumination} - G01B 9/02091: Tomographic interferometers, e.g. based on optical coherence - G01N 21/47: Scattering, i.e. diffuse reflection (G01N21/25, G01N21/41 take precedence {G01N21/55 takes precedence}) - G01N 21/4795: {spatially resolved investigating of object in scattering medium (in vivo A61B)} - G02B 21/0004: {specially adapted for specific applications} - G02B 21/082: {for incident illumination only} - G02B 21/14: affording illumination for phase-contrast observation - G06T 5/50: using two or more images, e.g. averaging or subtraction - G01N 2021/4709: {Backscatter} - G02B 21/18: Arrangements with more than one light path, e.g. for comparing two specimens - G06T 1/0007: {Image acquisition} - G06T 2207/10101: Optical tomography; Optical coherence tomography [OCT] - G02B: OPTICAL ELEMENTS, SYSTEMS OR APPARATUS - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ## Abstract A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals. ## Claims ### Claim 1 A system for full-field interference microscopy imaging of a diffusing three-dimensional sample comprising: an interference device comprising: an object arm configured to receive the sample, and a reference arm on which a reflection surface is arranged, the interference device being adapted to produce, when the sample is disposed on the object arm of the interference device, at each point of an imaging field, an interference between a reference wave obtained by reflection of incident light waves on an elementary surface of the reflection surface corresponding to said point of the imaging field, and an object wave obtained by backscattering of incident light waves by a voxel of a slice of the sample at a given depth, said voxel corresponding to said point of the imaging field; an acquisition device configured to acquire, with fixed optical path difference between the object arm and the reference arm, a temporal succession of N two-dimensional interferometric signals resulting from the interferences produced at each point of the imaging field; and a processing unit configured to compute an image representative of temporal variations of intensity between said N two-dimensional interferometric signals. ### Claim 2 (depends on 1) The imaging system as claimed in claim 1, wherein the processing unit is further configured to compute said image by computing, for each pixel of given position in said image, a pixel value as a function of a value of a parameter representative of the temporal variations of intensity of the N two-dimensional interferometric signals acquired at a point of corresponding position in a two-dimensional coordinate system associated with the acquisition device. ### Claim 3 (depends on 2) The imaging system as claimed in claim 2, wherein said parameter is representative of the temporal dispersion of the intensities of the N two-dimensional interferometric signals. ### Claim 4 (depends on 2) The imaging system as claimed in claim 2, wherein said pixel exhibits at least one component, defined in relation to a colorimetric representation space, whose value is a function of the value of said parameter. ### Claim 5 A method for full-field interference microscopy imaging of a diffusing three-dimensional sample comprising: placement of the sample on an object arm of an interference device; production, by means of the interference device for each point of an imaging field, of an interference between a reference wave obtained by reflection of incident light waves on an elementary surface of a reflection surface of a reference arm of the interference device, said elementary surface corresponding to said point of the imaging field, and an object wave obtained by backscattering of the incident wave by a voxel of a slice of the sample at a given depth, said voxel corresponding to said point of the imaging field; acquisition, with fixed optical path difference between the object arm and the reference arm, of a temporal succession of N two-dimensional interferometric signals resulting from the interferences for each point of the imaging field; and computation of an image representative of temporal variations of intensity between the N two-dimensional interferometric signals. ### Claim 6 (depends on 5) The imaging method as claimed in claim 5, wherein the step of computation of the image comprises the computation, for each pixel of given position in said image, of a pixel value as a function of a value of a parameter representative of the temporal variations of intensity of the N two-dimensional interferometric signals acquired at a point of corresponding position in a two-dimensional coordinate system associated with the acquisition device. ### Claim 7 (depends on 6) The imaging method as claimed in claim 6, wherein said parameter is representative of the temporal dispersion of said intensities of the N two-dimensional interferometric signals. ### Claim 8 (depends on 6) The imaging method as claimed in claim 6, wherein said pixel exhibits at least one component, defined in relation to a colorimetric representation space, whose value is a function of the value of said parameter.