High-electron-mobility transistor (HEMT) semiconductor devices with reduced dynamic resistance
AssigneeSemiconductor Components Industries, LLC
InventorsWoochul Jeon, Ali Salih, Llewellyn Vaughan-Edmunds
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AssigneeSemiconductor Components Industries, LLC
InventorsWoochul Jeon, Ali Salih, Llewellyn Vaughan-Edmunds
Estimating the term…
A semiconductor device includes a carrier generation layer disposed on a channel layer, a source contact and a drain contact disposed on the carrier generation layer, and a gate contact disposed between the source contact and the drain contact. The semiconductor device further includes a number N of conductive stripes disposed directly on the carrier generation layer in an area between the drain contact and the gate contact, and a number M of conductive transverse stripes disposed directly on the carrier generation layer in the area between the drain contact and the gate contact. Each of the N conductive stripes extends from and is electrically coupled to the drain contact. Each of the M conductive transverse stripes is aligned non-parallel to the N conductive stripes and is not in direct physical contact with the N conductive stripes.
A semiconductor device, comprising:
A semiconductor device, comprising:
A semiconductor device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.