Auto-power on mode for biased testing of a power management integrated circuit (PMIC)

An apparatus, comprising:

• logic associated with a system, wherein the logic is configured to cause the apparatus to:
• program, by a functional module tester, a power management integrated circuit (PMIC) of a memory system to a mode configured to cause the PMIC to apply a bias to a memory device of the memory system upon receiving power and independent of a command to apply the bias to the memory device;
• transmit, by a load board while the memory system is coupled with the load board in a test chamber that is separate from the functional module tester, power to the memory system while controlling, using the test chamber, one or more operating conditions of the memory system for a threshold time, the PMIC configured to apply the bias to the memory device based at least in part on programming the mode for the PMIC and transmitting the power to the memory system;
• and
• identify, by the functional module tester, a capability of the memory device or a defect of the memory device resulting from transmitting the power to the memory system while controlling the one or more operating conditions for the threshold time.

A non-transitory computer-readable medium storing code, the code comprising instructions executable by a processor to:

• program, by a functional module tester, a power management integrated circuit (PMIC) of a memory system to a mode for causing the PMIC to apply a bias to a memory device of the memory system upon receiving power and independent of a command to apply the bias to the memory device;
• transmit, by a load board while the memory system coupled with the load board in a test chamber that is separate from the functional module tester, power to the memory system while controlling, using the test chamber, one or more operating conditions of the memory system for a threshold time, the PMIC applying the bias to the memory device based at least in part on programming the mode for the PMIC and transmitting the power to the memory system;
• and
• identify, by the functional module tester, a capability of the memory device or a defect of the memory device resulting from transmitting the power to the memory system while controlling the one or more operating conditions for the threshold time.