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US 11,538,375 B2Granted
Pixel circuit and testing method
AssigneesChongqing BOE Display Technology Co., Ltd., Beijing BOE Technology Development Co., Ltd.
InventorsShicheng Sun, Jonguk Kwak, Dawei Shi, Wei Zhang, Cunzhi Li, Pei Wang
Life of this patent
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Abstract
The disclosure relates to a pixel circuit and a testing method of the pixel circuit. The pixel circuit comprises a light emitting element, a storage capacitor Cst, a drive sub-circuit, a reset sub-circuit, a write sub-circuit, a light emission control sub-circuit and a testing element, wherein a control terminal of the testing element is connected to s reset control signal line, a first terminal of the testing element is connected to a reset signal line, a second terminal of the testing element is connected to the drive sub-circuit, and the testing element is configured to test elements included in the pixel circuit.
Claims17
A pixel circuit, comprising:
- a light emitting element;
- a drive sub-circuit configured to generate a current for causing the light emitting element to emit light;
- a reset sub-circuit configured to receive a reset control signal from a reset control signal line and a reset signal from a reset signal line, and reset the drive sub-circuit and an anode of the light emitting element with the reset signal under the action of the reset control signal;
- a write sub-circuit configured to receive a data signal from a data line and a scan signal from a scan signal line, and to supply the data signal to the drive sub-circuit under the action of the scan signal;
- a light emission control sub-circuit configured to receive a first supply voltage from a first power line and a light emission control signal from a light emission signal line, and to supply the first supply voltage to the drive sub-circuit and the current generated by the drive sub-circuit to the anode of the light emitting element under the action of the light emission control signal;
- and
- a testing element, a control terminal of the testing element being connected to the reset control signal line, a first terminal of the testing element being connected to the reset signal line, a second terminal of the testing element being connected to the drive sub-circuit, and the testing element being configured to test elements included in the pixel circuit;
- wherein the pixel circuit further comprises:
- a plurality of testing terminals including testing control terminals and testing output terminals and configured in such a way that testing control signals are applied via the testing control terminals and testing output signals are acquired via the testing output terminals, so that the elements included in the pixel circuit are tested according to the testing output signals.
6 more elements
A display, comprising:
- a light emitting element;
- a drive sub-circuit configured to generate a current for causing the light emitting element to emit light;
- a reset sub-circuit configured to receive a reset control signal from a reset control signal line and a reset signal from a reset signal line, and reset the drive sub-circuit and an anode of the light emitting element with the reset signal under the action of the reset control signal;
- a write sub-circuit configured to receive a data signal from a data line and a scan signal from a scan signal line, and to supply the data signal to the drive sub-circuit under the action of the scan signal;
- a light emission control sub-circuit configured to receive a first supply voltage from a first power line and a light emission control signal from a light emission signal line, and to supply the first supply voltage to the drive sub-circuit and the current generated by the drive sub-circuit to the anode of the light emitting element under the action of the light emission control signal;
- and
- a testing element, a control terminal of the testing element being connected to a testing control terminal, a first terminal of the testing element being connected to the reset signal line, a second terminal of the testing element being connected to the drive sub-circuit, and the testing element being configured to test elements included in the pixel circuit;
- wherein the pixel circuit further comprises:
- a plurality of testing terminals including testing control terminals and testing output terminals and configured in such a way that testing control signals are applied via the testing control terminals and testing output signals are acquired via the testing output terminals, so that the elements included in the pixel circuit are tested according to the testing output signals.
6 more elements
Dependencies are inferred from the claim text.