US 11,536,769 B2 · Method for operating a test system and operation assistance apparatus

Abstract

The present invention relates a method and apparatus for setting a test configuration. A test device for testing a device under test is identified, and the measurement interfaces of the test device are assigned to appropriate measurement points of the device under test. The configuration of the test scenario is established by generating a representation of the test device and the connections between the interface of the test device and the related measurement points.

Drawings

Claims18

Dependent claims

A method for operating a test system for testing a device under test, the method comprising:

identifying a test device, the test device is configured to perform at least one test operation for testing the device under test;
assigning at least one measurement point of the device under test to an interface of the identified test device;
generating a dynamic representation of a test configuration which successively changes over time, wherein the generated dynamic representation is generated based on the identified test device and the assignment of the measurement points and the corresponding interfaces of the test device, wherein identifying the test device comprises automatically identifying the test device based on data received from the test device by a wired or wireless communication link, or by optical recognition of an image of the test device,
wherein generating the dynamic representation of the test configuration comprises:
providing a first connection between a measurement interface of the test device and a measurement point of the at least one measurement point of the device under test in the dynamic representation of the test configuration, and
adding a further connection to the dynamic representation of the test configuration when it is detected or confirmed that the first connection is established, to guide a user to establish multiple connections in a specific order,
wherein the generated dynamic representation of the test configuration comprises a first section and a second section, the first section is dynamically generated based on the identified test device, and the second section is dynamically generated based on the assignment of the measurement points and the corresponding interfaces of the test device, wherein the second section indicates which interface of the test device is connected to which measurement point of the device under test,
wherein the first section is only altered when a change in a configuration of the test device is detected, and
wherein the second section is only altered when a change in the properties in the connection between the test device and the device under test is detected.

6 more elements

An operation assistance apparatus comprising:

an interface for connection the operation assistance apparatus with a test device, the test device being configured to perform at least one test operation for testing a device under test;
and
a processor for identifying the test device connected to the operation assistance apparatus, assigning at least one measurement point of the device under test to an interface of the identified test device, and generating a dynamic representation of a test configuration which successively changes over time,
wherein the generated dynamic representation is generated based on the identified test device and the assignment of the assigned measurement points and the corresponding interfaces of the test device, and
wherein the test device is automatically identified based on data received from the test device by a wired or wireless communication link, or by optical recognition of an image of the test device,
wherein generating the dynamic representation of the test configuration by the processor comprises:
providing a first connection between a measurement interface of the test device and a measurement point of the at least one measurement point of the device under test in the dynamic representation of the test configuration, and
adding a further connection to the dynamic representation of the test configuration when it is detected or confirmed that the first connection is established, to guide a user to establish multiple connections in a specific order,
wherein the generated dynamic representation of the test configuration comprises a first section and a second section, wherein the processor is configured to dynamically generate the first section based on the identified test device, and to dynamically generate the second section based on the assignment of the measurement points and the corresponding interfaces of the test device, wherein the second section indicates which interface of the test device is connected to which measurement point of the device under test,
wherein the processor is configured to alter the first section only when a change in a configuration of the test device is detected, and
wherein the processor is configured to alter the second section only when a change in the properties in the connection between the test device and the device under test is detected.

8 more elements

Dependencies are inferred from the claim text.

Description6,271 words

Summary2,988 words

#The present invention relates to a method for operating a test system. The present invention further relates to an operation assistance apparatus.

#Although applicable in principle to any test system, the present invention and its underlying problem will be hereinafter described in connection with the operation of an oscilloscope.

#Testing modern devices, for example modern communication devices, requires a more and more complex test scenario. For establishing such test scenario, a number of one or more test devices have to be connected to multiple measurement points of the device under test.

Brief description of the drawings3 figures

#For a more complete understanding of the present invention and advantages thereof, reference is now made to the following description taken in conjunction with the accompanying drawings. The invention is explained in more detail below using exemplary embodiments, which are specified in the schematic figures of the drawings, in which:

#FIG. 1 shows a schematic block diagram of a test system with an operation assistance apparatus according to an embodiment;

#FIG. 2 shows a schematic representation of a test configuration according to an embodiment; and

Detailed description3,180 words

#The appended drawings are intended to provide further understanding of the embodiments of the invention. They illustrate embodiments and, in conjunction with the description, help to explain principles and concepts of the invention. Other embodiments and many of the advantages mentioned become apparent in view of the drawings. The elements in the drawings are not necessarily shown in scale.

#In the drawings, same, functionally equivalent and identic operating elements, features and components are provided with same reference signs in each case, unless stated otherwise.

#FIG. 1 shows a schematic illustration of a block diagram of a test system according to an embodiment. The test system may comprise an operation assistance apparatus 1, a test device 2 and a device under test 3. The device under test 3 may be any kind of device which shall be tested in the test scenario. For this purpose, a number of one or more wired connections have to be established between the device under test 3 and the test device 2.

Facts

Application

16/369,706Filed 29 Mar 2019

Published

US 2020/0309854 A11 Oct 2020

Granted

27 Dec 2022

Term ends

27 Aug 2040

Estimated · how

20 years from earliest known nonprovisional domestic filing plus recorded patent term adjustment, including 517 days of adjustment. Maintenance-fee lapses, terminal disclaimers and statutory extensions have not been checked. The continuity chain may be incomplete; this is not an enforceability determination.

Classification3 codes

G01R 31/31724
Testing of digital circuits: test controller, e.g. BIST state machine
G01R 31/31908
Tester configuration: tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
G01R
Measuring electric variables

Timeline

29 Mar 2019Application filedUS 16/369,706
24 Sep 2020Assigned to Rohde & Schwarz GmbH & Co. KGassignment of assignor's interest
1 Oct 2020PublishedUS 2020/0309854 A1
27 Dec 2022GrantedUS 11,536,769 B2
12 Oct 2026TodayWithin its term
27 Aug 2040Term endsEstimated, includes 517 days of adjustment

Method for operating a test system and operation assistance apparatus

Life of this patent

Method for operating a test system and operation assistance apparatus

Life of this patent

Life of this patent

Abstract

Drawings

Drawings

Claims18

Description6,271 words

Drawings

Classification3 codes

Life of this patent

Description6,271 words