Test board having semiconductor devices mounted as devices under test and test system including the test board
AssigneeSamsung Electronics Co., Ltd.
InventorsJoosung Yun, Soonil Kwon, Jihyun Choi
Life of this patent
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Abstract
A test board includes a board substrate, a connector at a side of the board substrate, a plurality of device-under-test (DUT) boards which are connected to the board substrate and on which semiconductor devices are mounted as DUTs, and a plurality of DC-DC converters connected to the plurality of DUT boards. The plurality of DC-DC converters convert an input voltage supplied thereto via the connector into operating voltages, and provide the operating voltages to the semiconductor devices on the plurality of DUT boards corresponding thereto. The operating voltages are substantially the same.
Claims18
A test board comprising:
- a board substrate;
- a connector at a side of the hoard substrate;
- a plurality of device-under-test (DUT) boards which are connected to the board substrate and on which semiconductor devices are mounted as DUTs;
- and
- a plurality of DC-DC converters connected to the plurality of DUT hoards,
- wherein the total number of the plurality of DC-DC converters is equal to the total number of the plurality of DUT boards,
- wherein the plurality of DC-DC converters convert an input voltage supplied thereto via the connector into operating voltages, and provide the operating voltages to the semiconductor devices on the plurality of DUT boards corresponding thereto, and
- wherein the operating voltages are substantially the same.
A test system comprising:
- test equipment including a test chamber;
- and
- a plurality of test boards configured to be supplied with an input voltage from the test equipment, and arranged in a test chamber,
- wherein each of the plurality of test boards comprises:
- a board substrate;
- a connector at a side of the board substrate;
- a plurality of device-under-test (DUI) boards which are connected to the board substrate and on which semiconductor devices are mounted as DUTs;
- and
- a plurality of DC-DC converters connected to the plurality of DUT boards,
- wherein the total number of the plurality of DC-DC converters is equal to the total number of the plurality of DUT boards,
- wherein the plurality of DC-DC converters convert an input voltage supplied thereto from the test equipment via the connector into operating voltages, provide the operating voltages to the semiconductor devices on the plurality of DUT boards corresponding thereto, generate a test input to be provided to the semiconductor devices on the plurality of DUT boards, and identify whether the semiconductor devices are defective, based on test outputs of the semiconductor devices, and
- wherein the operating voltages are substantially the same.
Dependencies are inferred from the claim text.