Test system and method for signal processing

#The invention relates to the technical field of signal processing and analyzation. In particular, the invention relates to a test system, a method for signal processing and a computer program.

#Many test instruments, such as oscilloscopes, are configured to receive and display measurement signals. An oscilloscope, for example, typically displays a waveform of the measurement signal. After being displayed by the oscilloscopes, the measurement signal is often post processed, for instance to perform a conformance test, or simply to zoom into a section of interest of the displayed signal.

#Such post processing can be performed with dedicated software, which often runs on an external device, e.g. a computer or a laptop. Typically, the user has to manually transfer the acquired test signal from the test instrument to the external device and initiate the post processing. For example, the user uploads the waveform of the measurement signal to the dedicated software and manually zooms into a section of interest of the waveform via a zoom function of the software. The user can then use a cursor or other measurement function of the software to analyze the waveform. However, this way of analyzing measurement signals can be cumbersome and slow.

#The invention will be explained in the followings together with the figures.

#FIG. 1 shows a schematic diagram of a test system according to an embodiment,

#FIG. 2a shows a schematic diagram of a display view according to an embodiment; and

#FIG. 1 shows a schematic diagram of a test system 100 according to an embodiment.

#The test system 100 comprises a test instrument 101 and a test application module 111. The test instrument 101 comprises an input port 103 configured to acquire a test signal, a display 105 configured to display a graphical representation 107 of the test signal, and an application interface 109 configured to forward, i.e. output, the test signal.

#The test application module 111 is configured to receive the forwarded test signal from the application interface 109 of the tests instrument 101. The test application module 111 comprises a processing unit 115 configured to further process the received test signal, and an instrument interface 113 configured to forward a result of the further processing of the test signal back to the test instrument 101 and/or to a further device.