Test and measurement instrument and method of analyzing an input signal

#The present disclosure generally relates to a test and measurement instrument. Further, the present disclosure relates to a method of analyzing an input signal by a test and measurement instrument.

#In the state of the art, different types of test and measurement instruments are known for analyzing an input signal provided by a device under test. Oscilloscopes correspond to a well-known type of test and measurement instruments. An oscilloscope can be operated in at least one of the two typical operation modes, namely a triggered operation mode as well as a continuous operation mode.

#In the triggered operation mode, an acquisition of the input signal is triggered by a trigger event wherein a pre-trigger memory section of an acquisition memory as well as a post-trigger memory section of the acquisition memory are filled in order to acquire a signal portion of the input signal that encompasses the trigger event. In fact, the pre-trigger memory section as well as the post-trigger memory section ensure that data of the input signal is acquired that occurs before and after the respective trigger event. However, additionally occurring trigger events may be missed by the oscilloscope during the acquisition of a respective trigger event, namely when the pre-trigger memory section and/or the post-trigger memory section are/is filled. This results in an incomplete acquisition since the acquisition does not comprise all occurring trigger events.

#The foregoing aspects and many of the attendant advantages of the claimed subject matter will become more readily appreciated as the same become better understood by reference to the following detailed description, when taken in conjunction with the accompanying drawings, wherein:

#FIG. 1 schematically shows a test and measurement instrument according to an embodiment of the present disclosure; and

#FIG. 2 schematically shows an overview of an example input signal encompassing several signal portions, signal segments as well as trigger events.

#The detailed description set forth below in connection with the appended drawings, where like numerals reference like elements, is intended as a description of various embodiments of the disclosed subject matter and is not intended to represent the only embodiments. Each embodiment described in this disclosure is provided merely as an example or illustration and should not be construed as preferred or advantageous over other embodiments. The illustrative examples provided herein are not intended to be exhaustive or to limit the claimed subject matter to the precise forms disclosed.

#In FIG. 1, a test and measurement instrument 10 is shown that is established by an oscilloscope. The test and measurement instrument 10 has a housing 12 at which a front end 14 is provided. The front end 14 comprises an input 16 that is used to be connected with a device under test. The device under test may provide an input signal that is processed by the test and measurement instrument 10.

#The test and measurement instrument 10 also comprises a digitizer circuit 18 that is connected with the input 16 such that an analog input signal received via the input 16 is digitized accordingly. In an embodiment, the digitizer includes, for example, an analog-to-digital (A/D) converter circuit.