Temperature detector

#This non-provisional application claims priority of Taiwan patent application No. 110111096, filed on 26 Mar. 2021, included herein by reference in its entirety.

#The present invention relates to a temperature detector, in particular to a temperature detector capable of generating an amplified detection current to reflect temperature variations of a circuit under test.

#The performances of electronic devices may be affected by temperature variations, and therefore, the amounts of temperature variations may be a crucial parameter to be considered in the design of the electronic devices. Typically, a temperature detector is utilized to measure the temperature variations. However, how to improve sensitivity and accuracy of a temperature measurement for the temperature detector remains a design challenge.

#FIG. 1 is a circuit schematic of a temperature detector according to an embodiment of the invention.

#FIG. 2 is a circuit schematic of a temperature detector according to another embodiment of the invention.

#FIG. 3 is a circuit schematic of a temperature detector according to another embodiment of the invention.

#Below, exemplary embodiments will be described in detail with reference to accompanying drawings so as to be easily realized by a person having ordinary knowledge in the art. The inventive concept may be embodied in various forms without being limited to the exemplary embodiments set forth herein. Descriptions of well-known parts are omitted for clarity, and like reference numerals refer to like components throughout.

#FIG. 1 is a circuit schematic of a temperature detector 1 according to an embodiment of the invention. The temperature detector 1 may be used to detect a temperature of a circuit under test, and generate an amplified detection current Ia accordingly. The temperature of the circuit under test may change over time. In other words, the temperature detector 1 may generate the amplified detection current Ia to reflect upon the temperature variation of the circuit under test.

#The temperature detector 1 may include a temperature coefficient component 10, a multiplier 12 and a node N1. The temperature coefficient component 10 may be arranged in proximity to the circuit under test, for example, 20 to 50 micrometers from the circuit under test, so as to accurately detect the temperature of the circuit under test. The temperature coefficient component 10 may include a first terminal and a second terminal. The first terminal of the temperature coefficient component 10 may be coupled to a first voltage terminal or a second voltage terminal. The multiplier 12 may include a first terminal, a second terminal and a control terminal. The first terminal of the multiplier 12 may be coupled to the first voltage terminal or the second voltage terminal, the second terminal of the multiplier 12 may be coupled to a third voltage terminal, and the control terminal of the multiplier 12 may be coupled to the second terminal of the temperature coefficient component 10. The first terminal of the temperature coefficient component 10 and the first terminal of the multiplier 12 may be selectively coupled to the same or different voltage terminals based on actual applications and design requirements. The first voltage terminal may be used to provide a voltage Vref1. The second voltage terminal may be used to provide a voltage Vref2. The voltages Vref1 and Vref2 may be operating voltages of the system, and may be substantially constant. Further, the voltages Vref1 and Vref2 may have identical or different electrical potentials. In some embodiments, the voltage Vref1 and/or Vref2 may be provided by an external circuit, and the external circuit may be, for example, a low dropout regulator (LDO). The third voltage terminal may be used to provide a voltage Vref3. The voltage Vref3 may be a ground voltage of the system, e.g., 0V The node N1 is formed between the second terminal of the temperature coefficient component 10 and the control terminal of the multiplier 12.