Light field display metrology
AssigneeMagic Leap, Inc.
InventorsIvan Li Chuen Yeoh, Lionel Ernest Edwin, Samuel A. Miller
Life of this patent
Estimating the term…
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AssigneeMagic Leap, Inc.
InventorsIvan Li Chuen Yeoh, Lionel Ernest Edwin, Samuel A. Miller
Estimating the term…
Examples of a light field metrology system for use with a display are disclosed. The light field metrology may capture images of a projected light field, and determine focus depths (or lateral focus positions) for various regions of the light field using the captured images. The determined focus depths (or lateral positions) may then be compared with intended focus depths (or lateral positions), to quantify the imperfections of the display. Based on the measured imperfections, an appropriate error correction may be performed on the light field to correct for the measured imperfections. The display can be an optical display element in a head mounted display, for example, an optical display element capable of generating multiple depth planes or a light field display.
An optical metrology system for performing image correction on a display, the system comprising:
Dependencies are inferred from the claim text.