Crystal form and salt form of pyridoimidazole compound and preparation method therefor

A compound of Formula (II) as represented by the following formula, or a crystal form C or D thereof:

• wherein,
• n2 is selected from 1;
• m2 is selected from 0, 0.5, 1, 1.5, 2, 2.5, 3, 3.5 and 4;
• the crystal form C of the compound of Formula (II) has an X-ray powder diffraction (XRPD) pattern with characteristic diffraction peaks at 2θ angles of 8.00±0.2°, 15.06±0.2°, 15.84±0.2°;
• the crystal form D of the compound of Formula (II) has an X-ray powder diffraction (XRPD) pattern with characteristic diffraction peaks at 2θ angles of 6.96±0.2°, 10.31±0.2°, 14.95±0.2°.

A compound of Formula (III) as represented by the following formula, or a crystal form F or G thereof:

• wherein,
• n3 is selected from 1;
• m3 is selected from 0, 0.5, 1, 1.5, 2, 2.5, 3, 3.5 and 4;
• wherein the crystal form F of the compound of Formula (III) has an X-ray powder diffraction (XRPD) pattern with characteristic diffraction peaks at 2θ angles of 6.47±0.2°, 9.11±0.2°, 9.90±0.2°;
• wherein the crystal form G of the compound of Formula (III) has an X-ray powder diffraction (XRPD) pattern with characteristic diffraction peaks at 2θ angles of 6.23±0.2°, 7.20±0.2°, 14.30±0.2°.

A compound of Formula (IV) as represented by the following formula, or a crystal form H, K, I or J thereof:

• wherein,
• n4 is selected from 1;
• m4 is selected from 0, 0.5, 1, 1.5, 2, 2.5, 3, 3.5 and 4;
• wherein the crystal form H of the compound of Formula (IV) has an X-ray powder diffraction (XRPD) pattern with characteristic diffraction peaks at 2θ angles of 4.71±0.2°, 5.56±0.2°, 18.16±0.2°;
• wherein the crystal form K of the compound of Formula (IV) has an XRPD pattern with characteristic diffraction peaks at 2θ angles of 4.83±0.2°, 7.39±0.2°, 14.80±0.2°;
• wherein the crystal form I of the compound of Formula (IV) has an XRPD pattern with characteristic diffraction peaks at 2θ angles of 4.89±0.2°, 6.19±0.2°, 7.45±0.2°;
• wherein the crystal form J of the compound of Formula (IV) has an XRPD pattern with characteristic diffraction peaks at 2θ angles of 4.97±0.2°, 16.33±0.2°, 23.92±0.2°.

A compound of Formula (V) represented by the following formula, or a crystal form L thereof:

• wherein,
• n5 is selected from 0.5 and 1;
• m5 is selected from 0, 0.5, 1, 1.5, 2, 2.5, 3, 3.5 and 4;
• wherein the crystal form L of the compound of Formula (V) has an X-ray powder diffraction (XRPD) pattern with characteristic diffraction peaks at 2θ angles of 10.39±0.2°, 18.04±0.2°, 20.31±0.2°.