Power supply, automated test equipment, method for operating a power supply, method for operating an automated test equipment and computer program using a voltage variation

An automated test equipment for testing a device under test comprising:

• a power supply configured to supply the device under test and comprising a voltage variation compensating circuit;
• a pattern generator configured to provide one or more stimulus signals for the device under test;
• and
• wherein the power supply is configured to perform an at least partial compensation of a voltage variation caused by a load change using the voltage variation compensation circuit configured to be activated simultaneously with one of:
• one or more of the stimulus signals and one or more response data signals from the device under test.

A non-transitory computer-readable medium having computer-readable program code embodied therein for causing a computer system to perform a method of operating an automated test equipment for testing a device, the method comprising:

• supplying power to the device under test,
• providing one or more stimulus signals for the device under test;
• and
• performing an at least partial compensation of a voltage variation caused by a load change using a voltage variation compensation circuit operable to be activated simultaneously with one of:
• one or more of the stimulus signals;
• and in response to one or more response data signals from the device under test.