Cylindrical member, contact probe and semiconductor inspection socket

A cylindrical member for use in a contact probe, comprising:

• a cylindrical base material including a portion at which opposing sides of a plate material made of beryllium copper are butted against each other, the portion extending along an axial line direction;
• an inner first coating layer and an outer first coating layer that are respectively formed on an inner surface and an outer surface of the base material and made of a Ni-based material and serve as a reinforcing material for the base material;
• and
• an inner second coating layer and an outer second coating layer that are respectively formed on the inner and outer first coating layers and made of a metal-based material different from the base material,
• wherein the first coating layer itself has higher hardness than the base material itself, and when a thickness of the cylindrical base material is represented by TB and a layer thickness of the first coating layer formed on the outer surface is represented by T1OUT, the base material is formed so as to satisfy 13 μm≤TB≤25 μm, and the first coating layer is formed so as to satisfy T1OUT≥TB×4%.