Cancer diagnosis by refractive index multifractality
AssigneeNanoscope Technologies, LLC
InventorsSamarendra Kumar Mohanty, Nirmalya Ghosh, Sulagna Bhattacharya
Life of this patent
Estimating the term…
Loading patent…
AssigneeNanoscope Technologies, LLC
InventorsSamarendra Kumar Mohanty, Nirmalya Ghosh, Sulagna Bhattacharya
Estimating the term…
A label-free optical device for near real time quantification of the multifractal micro-optical properties of a sample includes a source of broadband light; a tunable filter that receives at least a portion of the broadband light and then transmits narrowband light, whereby a specific band of light is selected to avoid unwanted absorption of light by the sample; where the narrowband light is configured to illuminate a selected area of the sample, and in response elastically-scattered light is dispersed from the sample; a light collection device configured to collect at least some of the elastically-scattered light; where at least some of the collected elastically-scattered light is configured to be transmitted to a detector by the light collection device, and the detector is configured to record a light scattering signal; and where the detector is configured to perform light scattering signal measurements at multiple angles or wavelengths to determine a refractive index multifractality of the sample.
A label-free optical device for near real time quantification of the multifractal micro-optical properties of a sample comprising:
Dependencies are inferred from the claim text.