Shape measuring method
AssigneeMitutoyo Corporation
InventorsLukasz Redlarski, Hideyuki Arai
Life of this patent
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AssigneeMitutoyo Corporation
InventorsLukasz Redlarski, Hideyuki Arai
Estimating the term…
A shape measuring apparatus applies, to a light beam, a periodic pattern having periodicity in a direction perpendicular to an optical axis and displaceable in the direction perpendicular to the optical axis, relatively displaces a focal point of an objective lens in a direction parallel to the optical axis, and calculates, based on amplitude of intensity of the light beam detected by a photodetector, face shape data on the object to be measured. Then, a top surface measuring step of acquiring face shape data on a top surface of the object to be measured, and a bottom surface measuring step of acquiring face shape data on a bottom surface of the object to be measured by transmitting through the top surface of the object to be measured and aligning the focal point of the objective lens on the bottom surface of the object to be measured are performed.
A shape measuring method using a shape measuring apparatus comprising:
Dependencies are inferred from the claim text.