Measurement point determination method, non-transitory storage medium, and measurement point determination apparatus
AssigneeMitutoyo Corporation
InventorsTakeshi Hagino, Yuto Inoue, Masayuki Nara
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitutoyo Corporation
InventorsTakeshi Hagino, Yuto Inoue, Masayuki Nara
Estimating the term…
A measurement point determination method for determining the number or an arrangement of measurement points for a measurement apparatus that performs measurement processing of a measurement item at a plurality of measurement points, the method comprises the steps of acquiring a minimum value and a maximum value of the number of measurement points, acquiring a target value of uncertainty for the measurement item of the measurement apparatus, estimating uncertainties when the measurement item is measured by the measurement apparatus using two or more of the numbers of measurement points between the minimum value and the maximum value of the number of measurement points, and determining the number of measurement points of the measurement apparatus on the basis of the target value and the estimated uncertainties.
A measurement point determination method for determining a number or an arrangement of measurement points for a coordinate measuring machine that performs measurement processing of a three-dimensional geometry of an object at a plurality of measurement points, the method comprising:
A measurement point determination apparatus for determining a number or an arrangement of measurement points for a coordinate measuring machine that performs measurement processing of a three-dimensional geometry of an object at a plurality of measurement points, the apparatus comprising:
Dependencies are inferred from the claim text.