Systems and methods for providing a beam of charged particles

A system for generating a beam of charged particles, the system comprising:

• an interaction chamber configured to support a target;
• one or more electromagnetic radiation sources configured to:
• provide a probe beam for determining orientation data of the target, the probe beam being configured to irradiate the target at a first energy;
• and
• provide a particle-generating beam for producing a beam of charged particles, the particle-generating beam being configured to irradiate the target at a second energy greater than the first energy;
• a sensor for measuring at least one property of a signal resulting from an interaction between the probe beam and the target;
• and
• at least one processor configured to:
• receive feedback information from the sensor;
• and
• cause a change in a relative orientation between the particle-generating beam and the target.