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US 11,494,892 B2Granted
Surface defect detection system
AssigneeABB Schweiz AG
InventorNevroz Sen
Life of this patent
Estimating the term…
Abstract
An inspection system is provided for detecting defects on surfaces. The system uses a pattern with varying color or darkness which faces the surface. A light illuminates the pattern on the surface so that the pattern and any defects on the surface are reflected and captured for image analysis. The processor then separates the pattern from the image in order to identify the locations of any defects on the surface.
Claims17
A system for detecting surface defects, comprising:
- a surface with a defect thereon;
- a pattern facing the surface with regions of varying color or darkness;
- a light source illuminating the surface;
- an image capturing device receiving a reflection of the pattern from the surface;
- a processor configured to identify the defect in the reflection after separating the regions of varying color or darkness from the reflection, by:
- separating the reflection into a first matrix including the regions of varying color or darkness and a second matrix including the defect;
- optimizing the first matrix and the second matrix, wherein the first matrix comprises a low-rank matrix and the second matrix comprises a sparse matrix;
- and
- an output device displaying a location of the defect on the surface.
6 more elements
A system for detecting surface defects, comprising:
- a surface with a defect thereon;
- a pattern facing the surface with regions of varying color or darkness;
- a light source illuminating the surface;
- an image capturing device receiving a reflection of the pattern from the surface;
- a processor configured to identify the defect in the reflection after separating the regions of varying color or darkness from the reflection, by:
- separating the reflection into a first matrix including the regions of varying color or darkness and a second matrix including the defect;
- and
- optimizing the first matrix and the second matrix, wherein the processor is configured to minimize a first characteristic of the first matrix and a second characteristic of the second matrix, the first and second characteristics being different from each other;
- and
- an output device displaying a location of the defect on the surface.
7 more elements
Dependencies are inferred from the claim text.