Dynamic ion filter for reducing highly abundant ions
AssigneeAnalytik Jena AG
InventorRoland Lehmann
Life of this patent
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Abstract
The present disclosure relates to a device for filtering at least one selected ion from an ion beam includes a unit for creating an electric field for accelerating the ions of the ion beam along a flight path of predefinable length, and a controllable ion optical system, which delimits the flight path in one direction, and which is used to deflect the selected ion from a flight path of the ion beam. The device is further designed to control the ion optical system subject to a flight time of the selected ion along the flight path. The present disclosure also relates to a mass spectrometer having a device according to the present disclosure, and to a method for filtering at least one selected ion from an ion beam.
Claims12
A device for filtering at least one selected ion from an ion beam, the device comprising:
- a unit configured to generate an electric field capable of accelerating ions of the ion beam along a flight path of predefinable length;
- an ion optical system configured to be controllable in a time-dependent manner, to delimit the flight path in one direction at an end portion of the flight path, and to deflect the at least one selected ion from the flight path of the ion beam;
- an ion trap configured to accumulate or deplete at least one predefined ion within at least one predefinable range, which range comprises non-deflected ions of the ion beam, wherein the ion trap is disposed between the ion optical system and a detector configured to record mass spectra;
- and
- a controller configured to control the ion optical system based on a flight time of the at least one selected ion along the flight path,
- wherein the ion optical system is configured to be switched on during at least one time interval in which the at least one selected ion passes through the ion optical system as to deflect the at least one selected ion from the flight path, wherein the at least one selected ion has an intensity or number exceeding a predefinable limit value.
A method for filtering at least one selected ion from an ion beam, the method comprising:
- accelerating ions comprising the ion beam along a flight path of predefinable length using a unit configured to generate an electric field capable of accelerating the ions;
- deflecting the at least one selected ion from the flight path of the ion beam based on a flight time of the at least one selected ion along the flight path using an ion optical system;
- controlling the ion optical system to be switched on during at least one time interval in which the at least one selected ion passes through the ion optical system as to deflect the at least one selected ion from the flight path, wherein the at least one selected ion has an intensity or number exceeding a predefinable limit value;
- and
- accumulating or depleting at least one predefined ion within at least one predefinable range, which range comprises non-deflected ions of the ion beam using an ion trap disposed between the ion optical system and a detector configured to record mass spectra.
Dependencies are inferred from the claim text.