Specimen measurement device and control method of specimen measurement device

A specimen measurement device which detects a measurement object material, comprising:

• a magnetic field generator configured to apply a magnetic field to a measurement cartridge, wherein the measurement cartridge comprises a substrate having a light-transmitting property, at least one first substance fixed on the substrate and specifically reacting with the measurement object material, at least one magnetic particle, and at least one second substance fixed on the at least one magnetic particle and specifically acting with the measurement object material;
• a detector configured to detect light passing through the substrate;
• and
• a controller configured to control the magnetic field generator to perform, after the measurement cartridge is set, a first magnetic field applying operation to apply a first magnetic field in a direction to move the at least one magnetic particle away from the substrate while a specimen solution containing the measurement object material is being introduced into the measurement cartridge, and then perform a second magnetic field applying operation to apply a second magnetic field in a direction to move the at least one magnetic particle toward the substrate, so that the at least one first substance and the at least one second substance are able to be bonded with each other via the measurement object material,
• wherein the controller starts:
• the second magnetic field applying operation after the first magnetic field applying operation is stopped;
• and
• a third magnetic field applying operation to apply a third magnetic field in a direction to move the magnetic particle away from the substrate after the second field applying operation is stopped.