Measurement device and measurement method

A measurement method of a measurement device including a spectroscope configured to measure light with a predetermined spectral wavelength of incident light from a measurement target and change the predetermined spectral wavelength, a movement mechanism configured to relatively move the spectroscope in one direction with respect to the measurement target, and one or more processors, the method comprising:

• determining, by the one or more processors, when the measurement target is a color patch and the spectroscope is relatively moved in the one direction, whether or not a measurement position measured by the spectroscope is moved into the color patch,
• causing, by the one or more processors, the spectroscope to execute measurement processing for a plurality of wavelengths set in advance while relatively moving the spectroscope in the one direction, and
• when at least one of amounts of variation of measured values with respect to each of the plurality of wavelengths obtained in the measurement processing exceeds a first threshold value and then each of the amounts of variation of the measured values of the plurality of wavelengths falls below a second threshold value which is less than or equal to the first threshold value, determining, by the one or more processors, that the measurement position measured by the spectroscope is moved into the color patch.