Microwave amplifiers tolerant to electrical overstress
AssigneeAnalog Devices International Unlimited Company
InventorsSrivatsan Parthasarathy, Javier A. Salcedo, Miguel Chanca
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AssigneeAnalog Devices International Unlimited Company
InventorsSrivatsan Parthasarathy, Javier A. Salcedo, Miguel Chanca
Estimating the term…
Microwave amplifiers tolerant to electrical overstress are provided. In certain embodiments, a monolithic microwave integrated circuit (MMIC) includes a signal pad that receives a radio frequency (RF) signal, a ground pad, a balun including a primary section that receives the RF signal and a secondary section that outputs a differential RF signal, an amplifier that amplifies the differential RF signal, and a plurality of decoupling elements, some of them electrically connected between the primary section and the ground pad, others electrically connected in the secondary section to a plurality of the amplifier's nodes, and operable to protect the amplifier from electrical overstress. Such electrical overstress events can include electrostatic discharge (ESD) events, such as field-induced charged-device model (FICDM) events, as well as other types of overstress conditions.
A monolithic microwave integrated circuit (MMIC) with integrated electrical overstress protection, the MMIC comprising:
The MMIC of Embodiment 1, further comprising a bias supply block configured to generate a regulated supply voltage for powering the amplifier, wherein the bias supply block includes a first control loop configured to set the regulated supply voltage based on a reference voltage, and a second control loop operable to control a current through the amplifier based on a reference current.
A method of electrical overstress protection in a monolithic microwave integrated circuit (MMIC), the method comprising:
A semiconductor die comprising:
Dependencies are inferred from the claim text.