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US 11,460,436 B2Granted
Component analysis method and component analysis device
AssigneeARKRAY, Inc.
InventorJin Yoshida
Life of this patent
Estimating the term…
Abstract
The present disclosure provides component analysis methods including a measurement process and an analysis process.
Claims20
A component analysis method comprising:
- a measurement process in which a sample solution that is continuously introduced into a flow path is separated into a plurality of components inside the flow path and is optically measured over time at a measurement position on the flow path to obtain optical measurement values;
- and
- an analysis process in which the plurality of components contained in a sample is analyzed based on the optical measurement values, the analysis process including:
- a base waveform acquisition process in which a base waveform is acquired by plotting the optical measurement values against a time axis on a two-dimensional plane;
- a measurement value differentiation process in which a measurement value differentiated waveform is acquired, which is a waveform obtained by differentiating the base waveform with respect to the optical measurement value along an axis of the optical measurement values;
- and
- a measurement value boundary determination process in which the optical measurement values corresponding to peaks in the measurement value differentiated waveform are determined to be separation boundaries between adjacent components of the plurality of components.
4 more elements
A component analysis method comprising:
- a measurement process in which a sample solution that is continuously introduced into a flow path is separated into a plurality of components inside the flow path and is optically measured over time at a measurement position on the flow path to obtain optical measurement values;
- and
- an analysis process in which the plurality of components contained in a sample is analyzed based on the optical measurement values, the analysis process including:
- a base waveform acquisition process in which a base waveform is acquired by plotting the optical measurement values against a time axis on a two-dimensional plane;
- a time differentiation process in which a time differentiated waveform is acquired, which is a waveform obtained by differentiating the base waveform with respect to time along the time axis;
- a reciprocal differentiation process in which a reciprocal differentiated waveform is acquired, which is a waveform obtained by plotting reciprocals of the time differentiated waveform along the time axis;
- and
- a time boundary determination process in which time points corresponding to peaks in the reciprocal differentiated waveform are determined to be separation boundaries between adjacent components in the plurality of components.
5 more elements
A component analysis device comprising:
- a flow path into which a sample solution is continuously introduced;
- and
- a processing unit comprising hardware configured to execute a program to implement:
- a measurement section that optically measures the sample solution over time, which is separated into a plurality of components inside the flow path, at a measurement position on the flow path to obtain optical measurement values;
- and
- an analysis unit that analyzes the plurality of components contained in a sample based on the optical measurement values, the analysis unit including:
- a base waveform acquisition section that acquires a base waveform by plotting the optical measurement values against a time axis on a two-dimensional plane;
- a measurement value differentiation section that acquires a measurement value differentiated waveform that is a waveform obtained by differentiating the base waveform with respect to the optical measurement value along an axis of the optical measurement values;
- and
- a measurement value boundary determination section that determines optical measurement values corresponding to peaks in the measurement value differentiated waveform to be separation boundaries between adjacent components into the plurality of components.
7 more elements
A component analysis device comprising:
- a flow path into which a sample solution is continuously introduced;
- and
- a processing unit comprising hardware configured to execute a program to implement:
- a measurement section that optically measures the sample solution over time, which is separated into a plurality of components inside the flow path, at a measurement position on the flow path to obtain optical measurement values;
- and
- an analysis unit that analyzes the plurality of components contained in a sample based on the optical measurement values, the analysis unit including:
- a base waveform acquisition section that acquires a base waveform by plotting the optical measurement values against a time axis on a two-dimensional plane;
- a time differentiation section that acquires a time differentiated waveform that is a waveform obtained by differentiating the base waveform with respect to time along the time axis;
- a reciprocal differentiation section that acquires a reciprocal differentiated waveform that is a waveform obtained by plotting reciprocals of the time differentiated waveform along the time axis;
- and
- a time boundary determination section that determines time points corresponding to peaks in the reciprocal differentiated waveform to be separation boundaries between adjacent components in the plurality of components.
8 more elements
Dependencies are inferred from the claim text.