Comparison circuit, semiconductor device, electronic component, and electronic device

A comparison circuit comprising:

• a first input terminal;
• a second input terminal;
• a first output terminal;
• and
• a differential input circuit comprising a differential pair of a first n-channel transistor and a second n-channel transistor each comprising a gate and a backgate,
• wherein the comparison circuit compares a negative voltage and a negative reference voltage and outputs a first output voltage from the first output terminal in response to a comparison result,
• wherein the negative voltage is input to the first input terminal,
• wherein a positive reference voltage is input to the second input terminal,
• wherein the positive reference voltage is determined so that comparison is performed,
• wherein a first bias voltage is input to one of the gate and the backgate of the first n-channel transistor,
• wherein the first input terminal is electrically connected to the other of the gate and the backgate of the first n-channel transistor,
• wherein the second input terminal is electrically connected to one of the gate and the backgate of the second n-channel transistor, and
• wherein a second bias voltage is input to the other of the gate and the backgate of the second n-channel transistor.