Test system, electronic device and loopback testing method

An electronic device, comprising a test system for performing loopback tests and at least one further electronic component,

• said test system comprising a processing module and loopback circuitry,
• said processing module comprising a signal source, an artificial intelligence circuit, an output port, and an input port;
• said output port being connected to said input port by said loopback circuitry;
• said signal source being configured to generate an output signal;
• said processing module being configured to output the output signal via said output port;
• said loopback circuitry being configured to at least one of transmit said output signal to said input port directly and transmit said output signal to said input port via said at least one further electronic component, thereby obtaining at least one input signal;
• said input port being configured to receive said at least one input signal, said input port further being configured to forward said at least one input signal to said artificial intelligence circuit;
• and
• said artificial intelligence circuit being configured to automatically perform a loopback test of at least one of said signal source and said further electronic component based on said at least one input signal,
• wherein said processing module, said loopback circuitry, and said at least one further electronic component are integrated into said electronic device.

A loopback testing method, said loopback testing method comprising:

• generating an output signal by a signal source of a processing module, said processing module having an input port and an output port;
• transmitting said output signal from said output port to said input port by loopback circuitry directly or via at least one further electronic component, thereby obtaining at least one input signal;
• receiving said input signal by said input port;
• and
• performing a loopback test of at least one of said signal source and said further electronic component based on said at least one input signal by an artificial intelligence circuit,
• wherein said processing module, said loopback circuitry, and said at least one further electronic component are integrated into a single electronic device.