Methods and measurement systems for precisely evaluating a device under test
AssigneeFraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
InventorsPaul Simon Holt Leather, Ramez Askar, Kei Sakaguchi, Thomas Haustein, Leszek Raschkowski
Life of this patent
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Abstract
A method includes defining a Center-of-Radiation Reference for a device under test, the CORR indicating a reference origin of an electromagnetic wave pattern formable with the DUT; determining a 3-dimensional orientation information with respect to the CORR, the 3-dimensional orientation information indicating a direction of the electromagnetic wave pattern; and providing the CORR and the 3-dimensional orientation information to a measurement system.
Claims29
A method comprising:
- defining a Center-of-Radiation Reference for a device under test, the CORR indicating a reference origin of an electromagnetic wave pattern formable with the DUT;
- wherein the CORR is arranged at a different position when compared to the reference origin and comprises information about an offset between the CORR and the reference origin,
- wherein the offset indicates the offset of the reference origin of the electromagnetic wave pattern with respect to the CORR;
- determining a 3-dimensional orientation information with respect to the CORR, the 3-dimensional orientation information indicating a direction of the electromagnetic wave pattern;
- and
- providing the CORR and the 3-dimensional orientation information to a measurement system.
A method comprising:
- detecting a radio frequency electromagnetic wave pattern from a DUT;
- receiving information indicating a Center-of-Radiation Reference for a device under test, the CORR indicating a reference origin of an electromagnetic wave pattern formed with the DUT and receiving a 3-dimensional orientation information with respect to the CORR, the 3-dimensional orientation information indicating a direction of the electromagnetic wave pattern;
- wherein the CORR is arranged at a different position when compared to the reference origin and comprises information about an offset between the CORR and the reference origin;
- wherein the offset indicates the offset of the reference origin of the electromagnetic wave pattern with respect to the CORR;
- and
- evaluating the detected radio frequency electromagnetic wave pattern with respect to a match with the CORR and the 3-dimensional orientation information.
A non-transitory digital storage medium having a computer program stored thereon to perform the method comprising:
- defining a Center-of-Radiation Reference for a device under test, the CORR indicating a reference origin of an electromagnetic wave pattern formable with the DUT such that the CORR is arranged at a different position when compared to the reference origin and comprises information about an offset between the CORR and the reference origin, wherein the offset indicates the offset of the reference origin of the electromagnetic wave pattern with respect to the CORR;
- determining a 3-dimensional orientation information with respect to the CORR, the 3-dimensional orientation information indicating a direction of the electromagnetic wave pattern;
- and
- providing the CORR and the 3-dimensional orientation information to a measurement system,
- when said computer program is run by a computer.
A non-transitory digital storage medium having a computer program stored thereon to perform the method comprising:
- detecting a radio frequency electromagnetic wave pattern from a DUT;
- receiving information indicating a Center-of-Radiation Reference for a device under test, the CORR indicating a reference origin of an electromagnetic wave pattern formed with the DUT and receiving a 3-dimensional orientation information with respect to the CORR, the 3-dimensional orientation information indicating a direction of the electromagnetic wave pattern;
- wherein the CORR is arranged at a different position when compared to the reference origin and comprises information about an offset between the CORR and the reference origin, wherein the offset indicates the offset of the reference origin of the electromagnetic wave pattern with respect to the CORR;
- and
- evaluating the detected radio frequency electromagnetic wave pattern with respect to a match with the CORR and the 3-dimensional orientation information,
- when said computer program is run by a computer.
Dependencies are inferred from the claim text.