Fatigue-free bipolar loop treatment to reduce imprint effect in piezoelectric device
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChi-Yuan Shih, Shih-Fen Huang, You-Ru Lin, Yan-Jie Liao
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsChi-Yuan Shih, Shih-Fen Huang, You-Ru Lin, Yan-Jie Liao
Estimating the term…
In some embodiments, the present disclosure relates to a method for recovering degraded device performance of a piezoelectric device. The method includes operating the piezoelectric device in a performance mode by applying one or more voltage pulses to the piezoelectric device, and determining that a performance parameter of the piezoelectric device has a first value that has deviated from a reference value by more than a predetermined threshold value during a first time period. During a second time period, the method further includes applying a bipolar loop to the piezoelectric device, comprising positive and negative voltage biases. During a third time period, the method further includes operating the piezoelectric device in the performance mode, wherein the performance parameter has a second value. An absolute difference between the second value and the reference value is less than an absolute difference between the first value and the reference value.
A method for recovering degraded device performance of a piezoelectric device, the method comprising:
A method for preventing degraded device performance of a piezoelectric device, the method comprising:
A system, the system comprising:
Dependencies are inferred from the claim text.