Wafer processing method
AssigneeDisco Corporation
InventorsShunsuke Teranishi, Shigefumi Okada, Shuichiro Tsukiji, Yuki Ikku
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Abstract
A wafer processing method for forming a modified layer within a wafer along planned dividing lines forms the modified layer within the wafer, positions a condensing point within the wafer or at a top surface of the wafer and applies a second laser beam while moving the condensing point, images reflected light, and determines a processed state of the wafer on the basis of an imaged image. The second laser beam is formed such that a sectional shape of the second laser beam in a plane perpendicular to a traveling direction of the second laser beam is not axisymmetric with respect to an axis along the planned dividing lines.
Claims12
A wafer processing method for forming a modified layer within a wafer along a plurality of planned dividing lines of the wafer, the wafer having the planned dividing lines set on a top surface of the wafer, the wafer processing method comprising:
- a holding step of making the top surface of the wafer face a chuck table, and holding the wafer by the chuck table;
- a modified layer forming step of forming the modified layer within the wafer by positioning a condensing point of a first laser beam having a wavelength transmissible through the wafer within the wafer and applying the first laser beam along the planned dividing lines from an undersurface side of the wafer while moving a laser beam irradiating unit and the chuck table relative to each other in a direction along the planned dividing lines;
- an observation laser beam applying step of, after the modified layer forming step, positioning a condensing point of a second laser beam having a power not exceeding a processing threshold value of the wafer and having a wavelength transmissible through the wafer within the wafer or at the top surface of the wafer, and applying the second laser beam from the undersurface side of the wafer while moving the wafer and the condensing point relative to each other in the direction along the planned dividing lines;
- an imaging step of imaging, by an imaging unit, reflected light of the second laser beam applied in the observation laser beam applying step;
- and
- a determining step of determining a processed state of the wafer on a basis of an image photographed in the imaging step,
- wherein the second laser beam applied to the wafer in the observation laser beam applying step is formed such that a sectional shape of the second laser beam as applied upon the undersurface side of the wafer is not axisymmetric with respect to an axis along the planned dividing lines.
A wafer processing method for forming a modified layer within a wafer along a plurality of planned dividing lines of the wafer, the wafer having the planned dividing lines set on a top surface of the wafer, the wafer processing method comprising:
- a holding step of making the top surface of the wafer face a chuck table, and holding the wafer by the chuck table;
- a modified layer forming step of forming the modified layer within the wafer by positioning a condensing point of a first laser beam having a wavelength transmissible through the wafer within the wafer and applying the first laser beam along the planned dividing lines from an undersurface side of the wafer while moving a laser beam irradiating unit and the chuck table relative to each other in a direction along the planned dividing lines;
- an observation laser beam applying step of, after the modified layer forming step, positioning a condensing point of a second laser beam having a power not exceeding a processing threshold value of the wafer and having a wavelength transmissible through the wafer within the wafer or at the top surface of the wafer, and applying the second laser beam from the undersurface side of the wafer while moving the wafer and the condensing point relative to each other in a direction orthogonal to the direction along the planned dividing lines such that the condensing point crosses the modified layer;
- an imaging step of imaging, by an imaging unit, reflected light of the second laser beam applied in the observation laser beam applying step;
- and
- a determining step of determining a processed state of the wafer on a basis of an image photographed in the imaging step,
- wherein the second laser beam applied to the wafer in the observation laser beam applying step is formed such that a sectional shape of the second laser beam as applied upon the undersurface side of the wafer is not axisymmetric with respect to an axis along the planned dividing lines.
Dependencies are inferred from the claim text.