Planarization of semiconductor devices
AssigneeTokyo Electron Limited
InventorsRyan Burns, Mark Somervell, Corey Lemley
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AssigneeTokyo Electron Limited
InventorsRyan Burns, Mark Somervell, Corey Lemley
Estimating the term…
In certain embodiments, a method for processing a substrate includes applying a surface treatment to selected surfaces of the substrate. The substrate has a non-planar topography including structures defining recesses. The method further includes depositing a fill material on the substrate by spin-on deposition. The surface treatment directs the fill material to the recesses and away from the selected surfaces to fill the recesses with the fill material without adhering to the selected surfaces. The method further includes removing the surface treatment from the selected surfaces of the substrate and depositing a planarizing film on the substrate by spin-on deposition. The planarizing film is deposited on the selected surfaces and top surfaces of the fill material.
A method for planarizing a substrate for patterning with a lithography process, the method comprising:
A method for processing a substrate, the method comprising:
A method for processing a substrate, the method comprising:
Dependencies are inferred from the claim text.