Activity coverage assessment of circuit designs under test stimuli
AssigneeSiemens Industry Software Inc.
InventorStephen Kenneth Sunter
Life of this patent
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Abstract
Aspects of the disclosed technology relate to techniques of activity coverage assessment. Transistor-level circuit simulation is performed for a circuit design under a set of test stimuli, which determines values of one or more electrical properties for each of circuit elements of interest in the circuit design. The one or more electrical properties are selected based on information of the each of circuit elements of interest, which comprises what circuit element type the each of circuit elements of interest belongs to. Based on the values of the one or more electrical properties, activity coverage information comprising information about which circuit elements in the circuit elements of interest are active or inactive under the set of test stimuli is determined.
Claims30
A method, executed by at least one processor of a computer, comprising:
- receiving information of a circuit design;
- performing transistor-level circuit simulation of the circuit design under a set of test stimuli, the transistor-level circuit simulation determining directly or indirectly values of one or more electrical properties for each of circuit elements of interest in the circuit design, the one or more electrical properties being selected based on information of the each of circuit elements of interest, the information of the each of circuit elements of interest comprising what circuit element type the each of circuit elements of interest belongs to;
- determining statistical values of the one or more electrical properties based on the values of the one or more electrical properties;
- and
- storing the statistical values of the one or more electrical properties, wherein the statistical values of the one or more electrical properties are used to determine activity coverage information, the activity coverage information comprising information about which circuit elements in the circuit elements of interest are active or inactive under the set of test stimuli.
One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
- receiving information of a circuit design;
- performing transistor-level circuit simulation of the circuit design under a set of test stimuli, the transistor-level circuit simulation determining directly or indirectly values of one or more electrical properties for each of circuit elements of interest in the circuit design, the one or more electrical properties being selected based on information of the each of circuit elements of interest, the information of the each of circuit elements of interest comprising what circuit element type the each of circuit elements of interest belongs to;
- determining statistical values of the one or more electrical properties based on the values of the one or more electrical properties;
- and
- storing the statistical values of the one or more electrical properties, wherein the statistical values of the one or more electrical properties are used to determine activity coverage information, the activity coverage information comprising information about which circuit elements in the circuit elements of interest are active or inactive under the set of test stimuli.
A system, comprising:
- one or more processors, the one or more processors programmed to perform a method, the method comprising:
- receiving information of a circuit design;
- performing transistor-level circuit simulation of the circuit design under a set of test stimuli, the transistor-level circuit simulation determining directly or indirectly values of one or more electrical properties for each of circuit elements of interest in the circuit design, the one or more electrical properties being selected based on information of the each of circuit elements of interest, the information of the each of circuit elements of interest comprising what circuit element type the each of circuit elements of interest belongs to;
- determining statistical values of the one or more electrical properties based on the values of the one or more electrical properties;
- and
- storing the statistical values of the one or more electrical properties, wherein the statistical values of the one or more electrical properties are used to determine activity coverage information, the activity coverage information comprising information about which circuit elements in the circuit elements of interest are active or inactive under the set of test stimuli.
Dependencies are inferred from the claim text.