Candidate element selection using significance metric values
AssigneeSap SE
InventorsJan Portisch, Ronald Boehle, Volker Saggau, Sandra Bracholdt
Life of this patent
Estimating the term…
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AssigneeSap SE
InventorsJan Portisch, Ronald Boehle, Volker Saggau, Sandra Bracholdt
Estimating the term…
Techniques and solutions are described for determining a set of elements of a second set that may correspond to a given element of a first set of elements. The elements can be, in specific examples, components of a database system, such as tables (or entities), attributes, or records. Significance metric values are calculated for elements in the first and second sets. The significance metric values can be a number of records in an entity or a number of read or write access operations for an entity or for a record of an entity. A significance metric value for the given element can be used at least in part to select elements of the second set as potential match candidates, based at least in part on significance metric values for elements of the second set. Selecting elements can include selecting elements based on a window of elements of the second set or a range of significance metric values.
A computing system comprising:
A method, implemented in a computing system comprising at least one hardware processor and at least one memory coupled to the at least one hardware processor, the method comprising:
One or more non-transitory computer-readable storage media comprising:
Dependencies are inferred from the claim text.