Abnormality detection support device, abnormality detection support method, and program
AssigneeNEC Corporation
InventorKatsuhiro Ochiai
Life of this patent
Estimating the term…
Loading patent…
AssigneeNEC Corporation
InventorKatsuhiro Ochiai
Estimating the term…
A system analysis support device includes a data acquisition part that obtains time series data (items) measured in a system that is to be analyzed, an overall abnormality degree calculation part that calculates transition of abnormality degree representing overall abnormality degree of the system that is to be analyzed, using a predictive model generated so that, with 2 or more time series data (items) as input, values representing a relationship between the 2 or more time series data (items) are outputted, and the time series data (items), and a representative index selection part that selects and presents time series data (items) indicating change similar to transition of the overall abnormality degree of the system that is to be analyzed, from among the time series data (items).
A system analysis support device, comprising:
A system analysis support method, performed by a computer, comprising:
A non-transitory computer-readable recording medium storing thereon a program that when executed by a computer performs a method comprising:
Dependencies are inferred from the claim text.