Base material evaluation method and curved glass evaluation device

A method for preparing a curved glass object or curved silicon object for measurement of a physical, chemical or optical property of a surface of the a curved glass object or curved silicon object, comprising:

• placing the a curved glass object or curved silicon object on a pedestal;
• deforming the curved glass object or curved silicon object on the pedestal from a curvature R1 to a curvature R2, wherein R2 is less than R1;
• and
• measuring the physical, chemical or optical property of the curved glass object or curved silicon object on the deformed surface thereof while the deformed curved glass object or deformed curved silicon object is on the pedestal;
• wherein the curved glass object or curved silicon object has a first main surface, a second main surface, and an end surface,
• the second main surface contacts the pedestal, and
• the measurement of the physical, chemical or optical property is on the first main surface.