Systems having light source with extended spectrum for semiconductor chip surface topography metrology
AssigneeYangtze Memory Technologies Co., Ltd.
InventorsSicong Wang, Xiaoye Ding
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AssigneeYangtze Memory Technologies Co., Ltd.
InventorsSicong Wang, Xiaoye Ding
Estimating the term…
Embodiments of systems for classifying interference signals are disclosed. In an example, a system for classifying interference signals includes an interferometer including a light source and a detector, and at least one processor. The interferometer is configured to provide a plurality of interference signals each corresponding to a respective one of a plurality of positions on a surface of a semiconductor chip. A spectrum of the light source is greater than a spectrum of white light. The at least one processor is configured to classify the interference signals into a plurality of categories using a model. Each of the categories corresponds to a region having a same material on the surface of the semiconductor chip.
A system for classifying interference signals, comprising:
A system for classifying interference signals, comprising:
A system for classifying spectrum signals, comprising:
Dependencies are inferred from the claim text.