LiDAR with malfunction detection

A light detection and ranging system comprising:

• a. one or more emitters that produce an outgoing set of light pulses over one or more fields of view (FOVs),
• b. a first detector that detects, a first plurality of light reflections,
• c. a second detector that detects, a second plurality of light reflections,
• wherein the first and second pluralities of light reflections originate within overlapping 2D angular ranges in the one or more FOVs, and correspond to at least some of the outgoing set of light pulse,
• d. electronic circuitry operably coupled to the first and second detectors, that
• processes at least some of the first plurality of light reflections to generate first reflection signals, the first reflections signals comprising first data indicative of reflection locations corresponding to the at least some of the first plurality of light reflections;
• processes at least some of the second plurality of light reflections to generate second reflection signals the second reflection signals comprising second data indicative of reflection locations corresponding to the at least some of the second plurality of light reflections;
• generates a difference value by comparing the first and second reflection signals, and
• generates a malfunction signal based at least in part on a magnitude of the difference value.

A method comprising:

• a. emitting with one or more emitters an outgoing set of light pulses in one or more fields of view (FOVs);
• b. generating first reflection signals by detecting with a first detector a first plurality of light reflections, from a first 2D angular range in at least one of the one or more FOVs;
• c. generating second reflection signals by detecting with a second detector a second plurality of light reflections, from a second 2D angular range in at least one of the one or more FOVs;
• wherein the first and second pluralities of light reflections, correspond to at least some of the outgoing set of light pulses, and
• d. processing at least some of the first reflection signals to generate first data;
• e. processing at least some of the second reflection signals to generate second data;
• f. calculating a difference value by comparing at least some of the first and second data;
• and
• g. generating a malfunction signal at an output pin of an electronic circuit based at least in part on a magnitude of the difference value.