Method for continuous tester operation during long soak time testing

A method for performing continuous semiconductor tester operation during long soak time testing using a chamberless asynchronous insertion model (AIM) handler using two manipulators, the method comprising:

• dividing a group of semiconductors having an ambient temperature into a first subgroup having a plurality of portions and a second subgroup having a plurality of portions, the second subgroup being identical to the first subgroup;
• inserting, by the handler using chucks, a first portion of the first subgroup into a first test site, and inserting a first portion of a second subgroup into a second test site;
• changing the temperature of the first portion of the first subgroup and the first portion of a second subgroup prior to testing from ambient temperature to a stabilized designated temperature during a soak time;
• electrically connecting the first portion of the first subgroup to the tester, and electrically disconnecting the first portion of the second subgroup from the tester;
• testing the first portion of the first subgroup;
• electrically disconnecting the first portion of the first subgroup from the tester and removing the first portion of the first subgroup from the first test site, while electrically connecting the first portion of the second subgroup to the testing the first portion of the second subgroup;
• electrically disconnecting the first portion of the second subgroup from the tester;
• and
• removing the first portion of the second subgroup from the second test site,
• wherein the testing of subgroups at the first test site and the second test site is performed through a multiplexing scheme, with trace length matching for all pairs of multiplexed signals.