Device and method for testing semiconductor devices

A testing circuit, comprising:

• a first circuit having a first capacitor and a second capacitor, the first circuit configured to transfer at least a portion of a first voltage across the first capacitor to the second capacitor;
• and
• a second circuit having the first capacitor and the second capacitor, the second circuit configured to transfer at least a portion of a second voltage across the second capacitor to the first capacitor;
• wherein
• the first circuit is connected to a first transistor to be tested;
• the first transistor has a gate configured to receive a first pulse signal;
• and
• the portion of the first voltage is transferred from the first capacitor to the second capacitor during a period of the first pulse signal;
• the second circuit is connected to a second transistor to be tested;
• the second transistor has a gate configured to receive a second pulse signal;
• and
• the portion of the second voltage is transferred from the second capacitor to the first capacitor during a period of the second pulse signal;
• further comprising:
• a first inductor having a first terminal connected to an input of the testing circuit and a second terminal connected to a drain of the first transistor;
• and
• a first diode having an anode connected to the second terminal of the first inductor and a cathode connected to a first terminal of the second capacitor,
• wherein the second capacitor has a second terminal connected to ground,
• wherein the first capacitor has a first terminal connected to the input of the testing circuit and a second terminal connected to ground, and
• wherein the first transistor has a source connected to ground.